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Basic Technique for Preparation of Down for Examination with the Scanning Electron Microscope

Authors:
Roxie C. Laybourne, Beth Ann Sabo, Ann Morningstar
Journal:
Auk
Volume:
109
Issue:
1 (January-March)
Year:
1992
Pages:
195-197
Section:
Short Communications And Commentaries
File attachments
p0195-p0197.pdf (240.58 KB)

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